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產品名稱:

差分探頭| P6251

更新時間:2024-09-07

產品型號:P6251

產品報價:

產品特點:差分探頭| P6251 ?Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface
?Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
?Remote GPIB/USB

P6251差分探頭| P6251的詳細資料:

差分探頭| P6251

差分探頭| P6251

Features & Benefits

Outstanding Electrical Performance

  • 1 GHz and 500 MHz Probe Bandwidth
  • <1 pF Differential Input Capacitance
  • 1 MΩ Differential Input Resistance
  • ±42 V (DC + pk AC) Differential Input Voltage
  • >18 dB CMRR (at 250 MHz 50X attenuation)
  • Selectable Bandwidth-limiting Filters
  • DC Reject

Versatile DUT Connectivity

  • Small Compact Probe Head for Probing Small Geometry Circuit Elements
  • Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
  • Robust Design for Reliability

Easy to Use

  • Provides Automatic Units Scaling and Readout on the Oscilloscope Display
  • TDP1000, TDP0500
    • Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface
    • Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
    • Remote GPIB/USB Probe Control through the Oscilloscope
    • AutoZero – Zeros Out Output Offset
  • P6251
    • Connect Directly to the TekProbe™ Interface Oscilloscopes, or to TekConnect® Oscilloscopes using TCA-BNC Adapter

Applications

  • High-speed Switch Mode Power Supply Design
  • CAN/LIN Bus Design
  • High-speed Digital Design
  • Digital Design and Characterization
  • Manufacturing Engineering Test
  • Research and Development

 

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, and P6251 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

  • Outstanding Electrical Performance
  • Versatile Device-Under-Test Connectivity
  • Ease of Use

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